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| > Artisan 0.18um Library |
> Virage Logic 0.18um Memory Compiler |
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| > Faraday 0.18um GII Library |
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| > Faraday 0.18um LL Library |
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| > VeriSilicon 0.18um Library |
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* * * Free Libraries * * * * * * *
Artisan 0.18um Library |
Standard Cell
478 high-density standard cells
9-track cell architecture
Average cell density of 111K gates/sq.mm
Multiple drive strengths
Routable in 3, 4, 5 or more metal layers
Comprehensive design tool support
Process specific electrical and physical tuning
Single-Port Synchronous SRAM Generators
Optimized for high density and high speed
Flex-Repair™ redundancy implementation option
- Includes separate Fuse-Box Generator
- Supports flexible BIST implementation
Broadly configurable to up to 512k bits:
- 256 to 16k words deep (word increment = 2 x column mux)
- 2 to 128 bits wide (bit increment = 1)
User-configurable mask write option (1 to 36 bit segments)
Aspect ratio control for efficient floor planning (column mux options: 4, 8, 16)
Memory operation and data retention at low voltage and down to 0 MHz
Low active power and leakage-only standby current
Accurate timing and power models
Complete set of models supporting industry-leading design tools
Robust design practices and validation procedures ensure successful designs
Extensive silicon validation
Dual-Port Synchronous SRAM Generator
Optimized for high density and high speed
Two fully-independent read/write ports
Broadly configurable to up to 256k bits:
- 128 to 8k words deep (word increment = 2 x column mux)
- 2 to 128 bits wide (bit increment = 1)
User-configurable mask write option (1 to 36 bit segments)
Aspect ratio control for efficient floor planning (column mux options: 4, 8, 16)
Memory operation and data retention at low voltage and down to 0 MHz
Low active power and leakage-only standby current
Accurate timing and power models
Complete set of models supporting industry-leading design tools
Robust design practices and validation procedures ensure successful designs
Extensive silicon validation
Inline I/O
600+ 3.3V/5VT
Pad pitch: 60 um
Input: pull-up/pull-down,Schmitt trigger,LVTTL,CMOS
Output: multiple current up tp 24mA with 3 slew rate options
ASpecial pads: clock, crystal oscillator, corner, power and ground
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Architecture |
Word |
Bit |
Mux |
Size |
Access Time (ns) |
Single Port Sync. SRAM |
16 - 8K
(Increment: 2X mux) |
2 - 128
(Increment: 1) |
4, 8, 16 |
32 bit - 512 Kbit |
4K x 16
Typical: 1.21
Worst: 2.13 |
Dual Port Sync. SRAM |
16 - 8K
(Increment: 2X mux) |
2 - 128
(Increment: 1) |
4, 8, 16 |
32 bit - 512 Kbit |
4K x 16
Typical: 1.28
Worst: 2.26 |
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Virtual Silicon 0.18um Library |
Standard Cell
500+ high performance standard cells
11-track cell architecture, performance optimized for 200~700 MHz
Average cell density of 90K gates/sq.mm
Multiple drive strengths
Layout using metal 1 only
Scan version of every flip-flop available
Fully contacted well ties
Accurate modeling and characterization for timing and power
Open architecture developers kit available
Inline and Staggered I/O
375+ 3.3V & 3.3V/5VT I/O pads
Pad pitch: 60um (In-line), 40um (Staggered)
Multiple current drives up to 24mA
Input: Pull-up/pull-down resistor, pad keeper, normal/ Schmitt
Output and bi-directional with slew rate control
Silicon proven ESD and latch-up structures
Analog power pads, crystal pads
Open architecture developers kit available
PLL Compilers
Programmable input, output frequencies and duty cycle
Input frequency range: 20 MHz - 200 MHz
Output frequency range: 50MHz -900MHz
PLL module entirely located in the I/O pad rings
Dedicated analog power supply pins
Build-in ESD and latch-up protection structures
Single Port Synchronons SRAM and Two Port Register File Compilers
Synchronous reads/writes
Static design with zero standby current
Byte write capability
Routable over the core with higher metal layer
Ability to compile to multiple aspect ratio
AScan and BIST support
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Architecture |
Word |
Bit |
Mux |
Size |
Access Time (ns) |
Single Port Sync. SRAM |
32 - 4K
(Increment: 2X mux) |
2 - 128
(Increment: 1) |
2, 4,
8, 16 |
32 bit - 256 Kbit |
4K x 16
Typical: 1.80
Worst: 3.36 |
Two Port Register File |
8 - 1K
(Increment: 2X mux) |
4 - 128
(Increment: 1) |
1, 2, 4 |
32 bit - 64 Kbit |
128K x 64
Typical: 1.37
Worst: 2.38 |
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| Faraday 0.18um GII Library |
Standard Cell
400+ high performance standard cells
9-track cell architecture
Average cell density >120K gates/sq.mm
Optimized multiple drive strengths
High porosity and routability
Scan version of every flip-flop available
Ultra low power cell available
Gated input for preventing leakage
Fully tool models support
Inline and Staggered I/O
1.8V, 3.3V I/O pads
1.8V/2.5VT, 3.3V/5VT I/O pads
Support over 500+ IO Functions
Pad pitch: 65um (In-line), 40um (Stagger)
Programmable current drives and slew rate control from 2mA to 16mA
Programmable pull-up/pull-down resistor, normal/ Schmitt trigger
Provide 90+ programming features in one I/O
In-line to staggered I/O corner available
Single Port SRAM, Dual Port SRAM, One Port Register File, Two Port Register File, and Via2 ROM Compilers
Synchronous reads/writes
Static design with zero standby current
Byte write capability
Provides both high speed and low power SRAMs
Ability to compile to multiple aspect ratio
Scan and BIST support
Power port connections support
Zero hold time for inputs
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Architecture |
Word |
Bit |
Mux |
Size |
Access Time (ns) |
Single Port
Sync. SRAM |
64 - 64K
(Increment: 16 x mux) |
1 - 128 (Increment: 1) |
1, 2, 4,
8, 16 |
64 bit - 512 Kbit |
4K x 16
Typical: 1.80
Worst: 3.1 |
Single Port Sync.
Register File |
32 - 2K
(Increment: 2 x mux) |
1 - 144 (Increment: 1) |
2, 4, 8 |
32 bit - 72 Kbit |
1K x 16
Typical: 1.63
Worst: 2.72 |
Dual Port Sync. SRAM |
64 - 32K
(Increment: 16 x mux) |
1 - 128 (Increment: 1) |
1, 2,
4, 8 |
64 bit - 512 Kbit |
4K x 16
Typical: 1.80
Worst: 3.1 |
Two Port Sync. Register File |
4 - 2K
(Increment: 2 x mux) |
2 - 144 (Increment: 1) |
2, 4, 8 |
8 bit - 72 Kbit |
1K x 64
Typical: 1.7
Worst: 2.8 |
Via2 ROM |
128 - 128K
(Increment:128 x mux) |
1 - 128 (Increment: 1) |
1, 2,
4, 8, |
128 bit - 2 Mbit |
4K x 16
Typical: 2
Worst: 3.4 |
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| Faraday 0.18um LL Library |
Standard Cell
400+ high performance standard cells
9-track cell architecture
Average cell density >120K gates/sq.mm
Optimized multiple drive strengths
High porosity and routability
Scan version of every flip-flop available
Ultra low power cell available
Gated input for preventing leakage
Fully tool models support
Inline and Staggered I/O
1.8V, 3.3V I/O pads
1.8V/2.5VT, 3.3V/5VT I/O pads
Support over 500+ IO Functions
Pad pitch: 65um (In-line), 40um (Stagger)
Programmable current drives and slew rate control from 2mA to 16mA
Programmable pull-up/pull-down resistor, normal/ Schmitt trigger
Provide 90+ programming features in one I/O
In-line to staggered I/O corner available
Single Port SRAM, Dual Port SRAM, Two Port Register File and Via1 ROM Compilers Synchronous reads/writes
Static design with zero standby current
Byte write capability
Provides both high speed and low power SRAMs
Ability to compile to multiple aspect ratio
Scan and BIST support
Zero hold time for inputs
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Architecture |
Word |
Bit |
Mux |
Size |
Access Time (ns) |
Single Port
Sync. SRAM |
64 - 64K
(Increment: 16 x mux) |
1 - 128 (Increment: 1) |
1, 2, 4, 8, 16 |
64 bit - 512 Kbit |
4K x 16
Typical: 2.70
Worst: 4.6 |
Dual Port Sync. SRAM |
64 - 32K
(Increment: 16 x mux) |
1 - 128 (Increment: 1) |
1, 2,
4, 8, |
64 bit - 512 Kbit |
4K x 16
Typical: 2.80
Worst: 4.8 |
Two Port Sync. Register File |
1 - 2K
(Increment: 1 x mux) |
1 - 144 (Increment: 1) |
1, 2,
4, 8 |
1 bit - 36 Kbit |
1K x 16
Typical: 4.7
Worst: 8 |
Via1 ROM |
256 - 128K
(Increment:256 x mux) |
1 - 128 (Increment: 1) |
1, 2,
4, 8, |
256 bit - 2 Mbit |
4K x 16
Typical: 3.8
Worst: 6.6 |
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| VeriSilicon 0.18um Library (HJTC 0.18um Logic 1P6M Salicide 1.8V/3.3V Process) |
High-Density Standard Cell
Wide Variety of Cell Functions and Drive Strengths.
Process-Specific Optimization for High-Density, High-Speed, and Low-Power.
Engineered for Synthesizability and Routability.
Scan Flip-flops for Design for Testability Support.
I/O Cell
3.3V I/O, 1.8V Core, 5V Tolerant.
Both Inline and Stagger Compatible IO Pads.
Configurable Input-Output and Skew Rate Control.
Robust ESD (>2000V) and Latch-up Immunity (¡À200 mA).
Competitive Pad Pitch and Height.
Single-Port / Dual-Port SRAM Compilers
Ultra-High Density, High-speed, and Low-Power.
Fully Static Operation and Automatic Power Down.
Adaptive Self-time Delay for Fast Access Time.
Full Suite of Design Views and Models.
Diffusion ROM Compiler
Ultra-High Density, High-speed, and Low-Power.
Fully Static Operation and Automatic Power Down.
Automatic Code Implementation.
High Capacity Configuration.
Full Suite of Design Views and Models.
Two-Port Register File Compiler
Ultra-High Density, High-speed, and Low-Power.
Fully Static Operation and Automatic Power Down.
Adaptive Self-time Delay for Fast Access Time.
Full Suite of Design Views and Models.
Supported Design Tools
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* * * Other Libraries * * * * * * *
Virage Logic 0.18um Memory Compiler |
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HJTC
Process
Type |
Word
Width
(bits/word) |
Word
Depth
(words) |
Max
Size
(K bits) |
Max
Configuration |
Aspect
Ratio
(Yes/No) |
Bit/Byte
write
capability |
Access Time(ns) |
SP HD SRAM |
GII |
2 - 128 |
16 - 16K |
32 - 512K |
16Kx32 |
Yes: 4, 8, 16 |
Yes |
No |
DP HD SRAM |
GII |
2 - 128 |
16 - 8K |
32 - 256K |
8Kx32 |
Yes: 4, 8, 16 |
Yes |
No |
2P Register File |
GII/LL |
2 - 256 |
8 - 1024 |
16 - 16K |
1Kx16 |
Yes: 1, 2, 4 |
Yes |
No |
ROM |
GII/LL |
8 - 64 |
256 - 64K |
2K - 1M |
64Kx16 |
Yes: 16, 32, 64 |
No |
No |
SP HS SRAM |
GII/LL |
2 - 256 |
16 - 16K |
32 - 512K |
16Kx32 |
4, 8, 16 |
Yes |
No |
DP HS SRAM |
GII/LL |
2 - 256 |
32 - 8K |
64 - 256K |
8Kx32 |
4, 8, 16 |
Yes |
No |
SP STAR
HD-4M
(SRAM with redundancy) |
GII |
8 - 256 |
128 - 64K |
16K - 4M |
64Kx64 |
Yes: 8, 16, 32 |
Yes |
Yes |
SP STAR
HS-512K (SRAM with redundancy) |
GII |
2 - 256 |
16 - 16K |
32 - 512K |
16Kx32 |
4, 8, 16 |
Yes |
Yes |
DP STAR
HS-512K
(SRAM with redundancy) |
GII |
2 - 256 |
32 - 8K |
64 - 256K |
8Kx32 |
4, 8, 16 |
Yes |
Yes |
T-CAM 32K |
GII |
16 - 64 |
16 - 512K |
1K - 32K |
512Kx64 |
1 |
No |
No |
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Artisan 0.18um Library |
Standard Cell
1000+ High Performance standard cells
9-track cell architecture
Average cell density of 73K gates/sq.mm
Multiple drive strengths
Silicon proven
Scan version of every flip-flop available
Compatible with mixed signal environment
Accurate timing and power models
In-line and staggered I/O
3.3V/5VT
Pad pitch: 76.8um (In-line), 38.4um (Staggered)
Multiple current drives up to 16mA
Pull ups, Pull downs, switchable
Hysteresis
Built-in level shifting |
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