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 Home -> Design Solution -> Libraries -> 0.18 micron Libraries
0.18 micron Libraries

We have helped to revolutionize the foundry industry by offering comprehensive free-of-charge libraries from multiple vendors. In addition, HJTC also offers other libraries available on a fee basis.

Free Libraries

Other Libraries

> Artisan 0.18um Library > Virage Logic 0.18um Memory Compiler
> Virtual Silicon 0.18um Library  
> Faraday 0.18um GII Library  
> Faraday 0.18um LL Library  
> VeriSilicon 0.18um Library  
   
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* * * Free Libraries * * * * * * *

Artisan 0.18um Library


Standard Cell
478 high-density standard cells
9-track cell architecture
Average cell density of 111K gates/sq.mm
Multiple drive strengths
Routable in 3, 4, 5 or more metal layers
Comprehensive design tool support
Process specific electrical and physical tuning

Single-Port Synchronous SRAM Generators
Optimized for high density and high speed
Flex-Repair™ redundancy implementation option
  - Includes separate Fuse-Box Generator
  - Supports flexible BIST implementation
Broadly configurable to up to 512k bits:
  - 256 to 16k words deep (word increment = 2 x column mux)
  - 2 to 128 bits wide (bit increment = 1)
User-configurable mask write option (1 to 36 bit segments)
Aspect ratio control for efficient floor planning (column mux options: 4, 8, 16)
Memory operation and data retention at low voltage and down to 0 MHz
Low active power and leakage-only standby current
Accurate timing and power models
Complete set of models supporting industry-leading design tools
Robust design practices and validation procedures ensure successful designs
Extensive silicon validation

Dual-Port Synchronous SRAM Generator
Optimized for high density and high speed
Two fully-independent read/write ports
Broadly configurable to up to 256k bits:
  - 128 to 8k words deep (word increment = 2 x column mux)
  - 2 to 128 bits wide (bit increment = 1)
User-configurable mask write option (1 to 36 bit segments)
Aspect ratio control for efficient floor planning (column mux options: 4, 8, 16)
Memory operation and data retention at low voltage and down to 0 MHz
Low active power and leakage-only standby current
Accurate timing and power models
Complete set of models supporting industry-leading design tools
Robust design practices and validation procedures ensure successful designs
Extensive silicon validation

Inline I/O
600+ 3.3V/5VT
Pad pitch: 60 um
Input: pull-up/pull-down,Schmitt trigger,LVTTL,CMOS
Output: multiple current up tp 24mA with 3 slew rate options
ASpecial pads: clock, crystal oscillator, corner, power and ground

Architecture

Word

Bit

Mux

Size

Access Time (ns)

Single Port Sync. SRAM

16 - 8K
(Increment: 2X mux)

2 - 128
(Increment: 1)

4, 8, 16

32 bit - 512 Kbit

4K x 16
Typical: 1.21
Worst: 2.13

Dual Port Sync. SRAM

16 - 8K
(Increment: 2X mux)

2 - 128
(Increment: 1)

4, 8, 16

32 bit - 512 Kbit

4K x 16
Typical: 1.28
Worst: 2.26

 

Virtual Silicon 0.18um Library


Standard Cell
500+ high performance standard cells
11-track cell architecture, performance optimized for 200~700 MHz
Average cell density of 90K gates/sq.mm
Multiple drive strengths
Layout using metal 1 only
Scan version of every flip-flop available
Fully contacted well ties
Accurate modeling and characterization for timing and power
Open architecture developers kit available

Inline and Staggered I/O
375+ 3.3V & 3.3V/5VT I/O pads
Pad pitch: 60um (In-line), 40um (Staggered)
Multiple current drives up to 24mA
Input: Pull-up/pull-down resistor, pad keeper, normal/ Schmitt
Output and bi-directional with slew rate control
Silicon proven ESD and latch-up structures
Analog power pads, crystal pads
Open architecture developers kit available

PLL Compilers
Programmable input, output frequencies and duty cycle
Input frequency range: 20 MHz - 200 MHz
Output frequency range: 50MHz -900MHz
PLL module entirely located in the I/O pad rings
Dedicated analog power supply pins
Build-in ESD and latch-up protection structures

Single Port Synchronons SRAM and Two Port Register File Compilers
Synchronous reads/writes
Static design with zero standby current
Byte write capability
Routable over the core with higher metal layer
Ability to compile to multiple aspect ratio
AScan and BIST support

Architecture

Word

Bit

Mux

Size

Access Time (ns)

Single Port Sync. SRAM

32 - 4K
(Increment: 2X mux)

2 - 128
(Increment: 1)

2, 4,
8, 16

32 bit - 256 Kbit

4K x 16
Typical: 1.80
Worst: 3.36

Two Port Register File

8 - 1K
(Increment: 2X mux)

4 - 128
(Increment: 1)

1, 2, 4

32 bit - 64 Kbit

128K x 64
Typical: 1.37
Worst: 2.38

Faraday 0.18um GII Library

Standard Cell
400+ high performance standard cells
9-track cell architecture
Average cell density >120K gates/sq.mm
Optimized multiple drive strengths
High porosity and routability
Scan version of every flip-flop available
Ultra low power cell available
Gated input for preventing leakage
Fully tool models support

Inline and Staggered I/O
1.8V, 3.3V I/O pads
1.8V/2.5VT, 3.3V/5VT I/O pads
Support over 500+ IO Functions
Pad pitch: 65um (In-line), 40um (Stagger)
Programmable current drives and slew rate control from 2mA to 16mA
Programmable pull-up/pull-down resistor, normal/ Schmitt trigger
Provide 90+ programming features in one I/O
In-line to staggered I/O corner available


Single Port SRAM, Dual Port SRAM, One Port Register File, Two Port Register File, and Via2 ROM Compilers
Synchronous reads/writes
Static design with zero standby current
Byte write capability
Provides both high speed and low power SRAMs
Ability to compile to multiple aspect ratio
Scan and BIST support
Power port connections support
Zero hold time for inputs

Architecture

Word

Bit

Mux

Size

Access Time (ns)

Single Port
Sync. SRAM

64 - 64K
(Increment: 16 x mux)

1 - 128 (Increment: 1)

1, 2, 4,
8, 16

64 bit - 512 Kbit

4K x 16
Typical: 1.80
Worst: 3.1

Single Port Sync.
Register File

32 - 2K
(Increment: 2 x mux)

1 - 144 (Increment: 1)

2, 4, 8

32 bit - 72 Kbit

1K x 16
Typical: 1.63
Worst: 2.72

Dual Port Sync. SRAM

64 - 32K
(Increment: 16 x mux)

1 - 128 (Increment: 1)

1, 2,
4, 8

64 bit - 512 Kbit

4K x 16
Typical: 1.80
Worst: 3.1

Two Port Sync. Register File

4 - 2K
(Increment: 2 x mux)

2 - 144 (Increment: 1)

2, 4, 8

8 bit - 72 Kbit

1K x 64
Typical: 1.7
Worst: 2.8

Via2 ROM

128 - 128K
(Increment:128 x mux)

1 - 128 (Increment: 1)

1, 2,
4, 8,

128 bit - 2 Mbit

4K x 16
Typical: 2
Worst: 3.4

Faraday 0.18um LL Library

Standard Cell
400+ high performance standard cells
9-track cell architecture
Average cell density >120K gates/sq.mm
Optimized multiple drive strengths
High porosity and routability
Scan version of every flip-flop available
Ultra low power cell available
Gated input for preventing leakage
Fully tool models support

Inline and Staggered I/O
1.8V, 3.3V I/O pads
1.8V/2.5VT, 3.3V/5VT I/O pads
Support over 500+ IO Functions
Pad pitch: 65um (In-line), 40um (Stagger)
Programmable current drives and slew rate control from 2mA to 16mA
Programmable pull-up/pull-down resistor, normal/ Schmitt trigger
Provide 90+ programming features in one I/O
In-line to staggered I/O corner available

Single Port SRAM, Dual Port SRAM, Two Port Register File and Via1 ROM Compilers Synchronous reads/writes
Static design with zero standby current
Byte write capability
Provides both high speed and low power SRAMs
Ability to compile to multiple aspect ratio
Scan and BIST support
Zero hold time for inputs

Architecture

Word

Bit

Mux

Size

Access Time (ns)

Single Port
Sync. SRAM

64 - 64K
(Increment: 16 x mux)

1 - 128 (Increment: 1)

1, 2, 4, 8, 16

64 bit - 512 Kbit

4K x 16
Typical: 2.70
Worst: 4.6

Dual Port Sync. SRAM

64 - 32K
(Increment: 16 x mux)

1 - 128 (Increment: 1)

1, 2,
4, 8,

64 bit - 512 Kbit

4K x 16
Typical: 2.80
Worst: 4.8

Two Port Sync. Register File

1 - 2K
(Increment: 1 x mux)

1 - 144 (Increment: 1)

1, 2,
4, 8

1 bit - 36 Kbit

1K x 16
Typical: 4.7
Worst: 8

Via1 ROM

256 - 128K
(Increment:256 x mux)

1 - 128 (Increment: 1)

1, 2,
4, 8,

256 bit - 2 Mbit

4K x 16
Typical: 3.8
Worst: 6.6

VeriSilicon 0.18um Library (HJTC 0.18um Logic 1P6M Salicide 1.8V/3.3V Process)

High-Density Standard Cell
Wide Variety of Cell Functions and Drive Strengths.
Process-Specific Optimization for High-Density, High-Speed, and Low-Power.
Engineered for Synthesizability and Routability.
Scan Flip-flops for Design for Testability Support.

I/O Cell
3.3V I/O, 1.8V Core, 5V Tolerant.
Both Inline and Stagger Compatible IO Pads.
Configurable Input-Output and Skew Rate Control.
Robust ESD (>2000V) and Latch-up Immunity (¡À200 mA).
  Competitive Pad Pitch and Height.

Single-Port / Dual-Port SRAM Compilers
Ultra-High Density, High-speed, and Low-Power.
Fully Static Operation and Automatic Power Down.
Adaptive Self-time Delay for Fast Access Time.
Full Suite of Design Views and Models.

Diffusion ROM Compiler
Ultra-High Density, High-speed, and Low-Power.
Fully Static Operation and Automatic Power Down.
Automatic Code Implementation.
High Capacity Configuration.
Full Suite of Design Views and Models.

Two-Port Register File Compiler
Ultra-High Density, High-speed, and Low-Power.
Fully Static Operation and Automatic Power Down.
Adaptive Self-time Delay for Fast Access Time.
Full Suite of Design Views and Models.

Supported Design Tools
EDA Vendor Tools

Cadence

Ambit, NC-Verilog, SoC Encounter, Silicon Ensemble-PKS, Dracula ¡­

Synopsys

Design Compiler, Prime Time, Physical Compiler, DFT Compiler, TetraMax ATPG, Formality, Astro, Apollo, Hercules ¡­

Mentor Graphics

Calibre, FastScan, DFTAdvisor, ModelSim¡­

Magma

Blast Fusion, Blast RTL ¡­

* * * Other Libraries * * * * * * *

Virage Logic 0.18um Memory Compiler

 

HJTC
Process
Type

Word
Width
(bits/word)

Word
Depth
(words)

Max
Size
(K bits)

Max
Configuration

Aspect
Ratio
(Yes/No)

Bit/Byte
write
capability

Access Time(ns)

SP HD SRAM

GII

2 - 128

16 - 16K

32 - 512K

16Kx32

Yes: 4, 8, 16

Yes

No

DP HD SRAM

GII

2 - 128

16 - 8K

32 - 256K

8Kx32

Yes: 4, 8, 16

Yes

No

2P Register File

GII/LL

2 - 256

8 - 1024

16 - 16K

1Kx16

Yes: 1, 2, 4

Yes

No

ROM

GII/LL

8 - 64

256 - 64K

2K - 1M

64Kx16

Yes: 16, 32, 64

No

No

SP HS SRAM

GII/LL

2 - 256

16 - 16K

32 - 512K

16Kx32

4, 8, 16

Yes

No

DP HS SRAM

GII/LL

2 - 256

32 - 8K

64 - 256K

8Kx32

4, 8, 16

Yes

No

SP STAR
HD-4M
(SRAM with redundancy)

GII

8 - 256

128 - 64K

16K - 4M

64Kx64

Yes: 8, 16, 32

Yes

Yes

SP STAR
HS-512K (SRAM with redundancy)

GII

2 - 256

16 - 16K

32 - 512K

16Kx32

4, 8, 16

Yes

Yes

DP STAR
HS-512K
(SRAM with redundancy)

GII

2 - 256

32 - 8K

64 - 256K

8Kx32

4, 8, 16

Yes

Yes

T-CAM 32K

GII

16 - 64

16 - 512K

1K - 32K

512Kx64

1

No

No

Artisan 0.18um Library


Standard Cell
1000+ High Performance standard cells
9-track cell architecture
Average cell density of 73K gates/sq.mm
Multiple drive strengths
Silicon proven
Scan version of every flip-flop available
Compatible with mixed signal environment
Accurate timing and power models

In-line and staggered I/O
3.3V/5VT
Pad pitch: 76.8um (In-line), 38.4um (Staggered)
Multiple current drives up to 16mA
Pull ups, Pull downs, switchable
Hysteresis
Built-in level shifting